Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications
Author:
Affiliation:
1. Karlsruhe Institute of Technology (KIT), Institut für Hochfrequenztechnik und Elektronik (IHE), Kaiserstrasse 12, 76131, Germany
2. Fraunhofer Institute for Applied Solid State Physics (IAF), Tullastrasse 12, 79108 Freiburg, Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6516159/6518281/06518338.pdf?arnumber=6518338
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