A Novel Simple CBCM Method Free From Charge Injection-Induced Errors-Reference-Cited by-同舟云学术

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A Novel Simple CBCM Method Free From Charge Injection-Induced Errors

Published:2004-05 Issue:5 Volume:25 Page:262-264
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:en
Short-container-title:IEEE Electron Device Lett.

Author:

Chang Y.-W.,Chang H.-W.,Hsieh C.-H.,Lai H.-C.,Lu T.-C.,Ting W.,Ku J.,Lu C.-Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/28808/01295101.pdf?arnumber=1295101

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Energy-efficient memcapacitor devices for neuromorphic computing;Nature Electronics;2021-10

2. Calibration of CBCM Measurement Hardware;2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS);2020-05

3. Monitoring Test Structure for Plasma Process-Induced Charging Damage Using Charge-Based Capacitance Measurements;IEEE Transactions on Semiconductor Manufacturing;2016-08

4. Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement;IEICE Transactions on Electronics;2016

5. Logarithmic derivative method and system for capacitance measurement;Review of Scientific Instruments;2015-08

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