Author:
Manabe Kenzo,Watanabe Koji,Jagannathan Hemanth,Paruchuri Vamsi K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Low-frequency noise analysis of DRAM peripheral transistors with La cap;2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT);2014-10
2. Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs;Semiconductor Science and Technology;2014-09-15
3. Conclusions and Future Scope;Analog Circuits and Signal Processing;2013-08-14