A Probabilistic Context-Free Grammar Based Random Test Program Generation
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/8048781/8049708/08049809.pdf?arnumber=8049809
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. TAF: a Tool for Diverse and Constrained Test Case Generation;2021 IEEE 21st International Conference on Software Quality, Reliability and Security (QRS);2021-12
2. Inputs from Hell Learning Input Distributions for Grammar-Based Test Generation;IEEE Transactions on Software Engineering;2020
3. FT-EST Framework: Reliability Estimation for the Purposes of Fault-Tolerant System Design Automation;2018 21st Euromicro Conference on Digital System Design (DSD);2018-08
4. Evaluation Platform for Testing Fault Tolerance Properties: Soft-core Processor-Based Experimental Robot Controller;2018 21st Euromicro Conference on Digital System Design (DSD);2018-08
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