Recovering or Testing Extended-Affine Equivalence
Author:
Affiliation:
1. Inria, Paris, France
2. Inria, Laboratoire LIX, Ùcole Polytechnique, Institut Polytechnique de Paris, Palaiseau, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Library and Information Sciences,Computer Science Applications,Information Systems
Link
http://xplorestaging.ieee.org/ielx7/18/9861208/09758689.pdf?arnumber=9758689
Reference43 articles.
1. On the differential equivalence of APN functions
2. Crooked maps in F2n
3. Anomalies and Vector Space Search: Tools for S-Box Analysis
4. Algorithmic Cryptanalysis
5. New classes of almost bent and almost perfect nonlinear polynomials
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