One-Bit Constrained Measurements of Parametric Signals
Author:
Affiliation:
1. Department of Engineering, University of Perugia, Perugia, Italy
2. Department INDI, Vrije Universiteit Brussel, Brussels, Belgium
Funder
Ricerca di Base 2019
Ricerca di Base 2020 (tecniche avanzate di stima parametrica e caratterizzazione di segnali e sistemi), University of Perugia
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/9717300/09792400.pdf?arnumber=9792400
Reference47 articles.
1. One-Bit Sine-Fit
2. Computing the zeros, maxima and inflection points of Chebyshev, Legendre and Fourier series: solving transcendental equations by spectral interpolation and polynomial rootfinding
3. Statistical Evaluation of Signal-to-Noise Ratio and Timing Jitter in Equivalent-Time Sampling Signals
4. Decoding by Linear Programming
5. Optimal estimation theory for dynamic systems with set membership uncertainty
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