Characterization Technique to Reveal Critical Resonances in Nonlinear RF Circuits-Reference-Cited by-同舟云学术

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Characterization Technique to Reveal Critical Resonances in Nonlinear RF Circuits

Published:2022 Issue: Volume:71 Page:1-11
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Otegi Nerea¹^ORCID,Collantes Juan-Mari¹^ORCID,Lizarraga Ibone¹^ORCID,Gonzalez Jose Manuel²^ORCID

Affiliation:

1. Departamento de Electricidad y Electrónica, Universidad del País Vasco/Euskal Herriko Unibertsitatea (UPV/EHU), Bilbao, Spain

2. Departamento de Tecnología Electrónica, Universidad del País Vasco/Euskal Herriko Unibertsitatea (UPV/EHU), Vitoria-Gasteiz, Spain

Funder

Spanish Administration

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9717300/09764705.pdf?arnumber=9764705

Reference31 articles.

1. Sensitivity Enhancement in Pole-Zero Identification Based Stability Analysis of Microwave Circuits

2. Improvement of Intermodulation Distortion Asymmetry Characteristics With Wideband Microwave Signals in High Power Amplifiers

3. Experimental Investigation of Bifurcation Behavior in Nonlinear Microwave Circuits

4. An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detecting Low-Frequency Critical Resonances in Power Amplifiers Using the Periodicity of Floquet Exponents;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11

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