Impact of Channel Implant Variation on RTN and Flicker Noise
Author:
Affiliation:
1. Fraunhofer-CNT, Fraunhofer-IPMS,Dresden,Germany
2. GLOBALFOUNDRIES Dresden, GLOBALFOUNDRIES,Dresden,Germany
3. Technische Universität Bergakademie Freiberg,Freiberg,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9365069/9365279/09365296.pdf?arnumber=9365296
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