Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons
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Published:1997
Issue:8
Volume:16
Page:930-935
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ISSN:0278-0070
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Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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language:
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Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Yu S.,Jervis B.W.,Eckersall K.R.,Bell I.M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software