Novel Methods of Fabrication and Metrology of Superconducting NanoStructures-Reference-Cited by-同舟云学术

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Novel Methods of Fabrication and Metrology of Superconducting NanoStructures

Published:2007-04 Issue:2 Volume:56 Page:392-396
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hao Ling,Macfarlane John C.,Gallop John C.,Cox David,Joseph-Franks Patrick,Hutson David,Chen Jie,Lam S. K. H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/4126824/04126871.pdf?arnumber=4126871

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Superconducting properties of NbN film, bridge and meanders;AIP Advances;2018-05

2. Magnetometry with Low-Resistance Proximity Josephson Junction;Journal of Low Temperature Physics;2018-02-02

3. Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces;Applied Physics Letters;2016-01-25

4. Non-hysteretic superconducting quantum interference proximity transistor with enhanced responsivity;Applied Physics Letters;2014-02-24

5. Metastability in a nanobridge-based hysteretic dc SQUID embedded in a superconducting microwave resonator;Physical Review B;2011-03-17

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