Funder
National Science Foundation
Semiconductor Research Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Library and Information Sciences,Computer Science Applications,Information Systems
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A defect tolerance framework for improving yield;Proceedings of the 59th ACM/IEEE Design Automation Conference;2022-07-10
2. Automated Design For Yield Through Defect Tolerance;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04