Group Testing Schemes From Codes and Designs
Author:
Funder
NSF
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Library and Information Sciences,Computer Science Applications,Information Systems
Link
http://ieeexplore.ieee.org/ielaam/18/8071168/8022940-aam.pdf
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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4. Improved Bounds For Efficiently Decodable Probabilistic Group Testing With Unreliable Items;2023 IEEE Information Theory Workshop (ITW);2023-04-23
5. Probabilistic Group Testing with a Linear Number of Tests;2021 IEEE International Symposium on Information Theory (ISIT);2021-07-12
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