Trends in silicon-on-silicon multichip modules

Author:

Frye R.C.,Tai K.L.,Lau M.Y.,Gabara T.J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. The evolution of silicon photonics as an enabling technology for optical interconnection;Laser & Photonics Reviews;2012-01-17

2. A test methodology for high performance MCMs;Journal of Electronic Testing;1997

3. A Test Methodology for High Performance MCMs;Frontiers in Electronic Testing;1997

4. Planar clock routing for high performance chip and package co-design;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;1996-06

5. A wafer level testability approach based on an improved scan insertion technique;IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B;1995-08

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