Binary-Level Testing of Embedded Programs

Author:

Bardin Sebastien,Baufreton Philippe,Cornuet Nicolas,Herrmann Philippe,Labbe Sebastien

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Toward Rigorous Object-Code Coverage Criteria;2017 IEEE 28th International Symposium on Software Reliability Engineering (ISSRE);2017-10

2. Discovering instructions for robust binary-level coverage criteria;Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems;2017-07-13

3. Specification of concretization and symbolization policies in symbolic execution;Proceedings of the 25th International Symposium on Software Testing and Analysis;2016-07-18

4. Finding the needle in the heap;Proceedings of the 6th Workshop on Software Security, Protection, and Reverse Engineering - SSPREW '16;2016

5. Source-Code-to-Object-Code Traceability Analysis for Avionics Software: Don’t Trust Your Compiler;Lecture Notes in Computer Science;2015

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