Author:
Huard V.,Pion E.,Cacho F.,Croain D.,Robert V.,Delater R.,Mergault P.,Engels S.,Flatresse P.,Amador N. Ruiz,Anghel L.
Cited by
5 articles.
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1. Understanding Ageing Mechanisms;Ageing of Integrated Circuits;2019-10-01
2. Introduction;Long-Term Reliability of Nanometer VLSI Systems;2019
3. Manufacturing Threats;Dependable Multicore Architectures at Nanoscale;2017-08-30
4. Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes;Microprocessors and Microsystems;2015-11
5. Efficient NBTI modeling technique considering recovery effects;Proceedings of the 2014 international symposium on Low power electronics and design;2014-08-11