Electromigration recovery and short lead effect under bipolar- and unipolar-pulse current
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6235191/6241755/06241869.pdf?arnumber=6241869
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines;Proceedings of the 2023 International Symposium on Physical Design;2023-03-26
2. Black’s Law in Light of Low Frequency Pulsed Power Electromigration;2022 IEEE International Integrated Reliability Workshop (IIRW);2022-10-09
3. Avoidance vs. repair: New approaches to increasing electromigration robustness in VLSI routing;Integration;2020-11
4. Machine Learning Approach for Fast Electromigration Aware Aging Prediction in Incremental Design of Large Scale On-chip Power Grid Network;ACM Transactions on Design Automation of Electronic Systems;2020-10-02
5. Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing;Integration;2017-06
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