Author:
Jagannathan S.,Diggins Z.,Mahatme N.,Loveless T. D.,Bhuva B. L.,Wen S-J.,Wong R.,Massengill L. W.
Cited by
9 articles.
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1. BEC: Bit-Level Static Analysis for Reliability against Soft Errors;2024 IEEE/ACM International Symposium on Code Generation and Optimization (CGO);2024-03-02
2. Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies;2022 IEEE International Test Conference (ITC);2022-09
3. Trace-and-brace (TAB): bespoke software countermeasures against soft errors;Proceedings of the 23rd ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems;2022-06-14
4. Soft Error Detection through Low-level Re-execution;2021 5th International Conference on System Reliability and Safety (ICSRS);2021-11-24
5. MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology;IEICE Electronics Express;2020