Author:
Croes K.,Lesniewska A.,Wu C.,Ciofi I.,Banczerowska A.,Briggs B.,Demuynck S.,Tokei Zs.,Bommels J.,Saad Y.,Gao W.
Cited by
1 articles.
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1. Polarity Dependency of MOL-TDDB in FinFET;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03