Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays-Reference-Cited by-同舟云学术

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Published:2015-08 Issue:8 Volume:62 Page:2502-2509
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Grossi Alessandro,Walczyk Damian,Zambelli Cristian,Miranda Enrique,Olivo Piero,Stikanov Valeriy,Feriani Alessandro,Sune Jordi,Schoof Gunter,Kraemer Rolf,Tillack Bernd,Fox Alexander,Schroeder Thomas,Wenger Christian,Walczyk Christian

Funder

ENIAC Joint Undertaking 2013-2 through the PANACHE Project

German Research Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/7163647/07131534.pdf?arnumber=7131534

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