BinSide : Static Analysis Framework for Defects Detection in Binary Code
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9356870/9356948/09356991.pdf?arnumber=9356991
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A framework for static analysis and verification of low-level RTOS code;Journal of Systems Architecture;2024-09
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3. Automatic Repair Method for Null Pointer Dereferences Guided by Program Dependency Graph;Symmetry;2022-07-28
4. Analytical Modeling for Identification of the Machine Code Architecture of Cyberphysical Devices in Smart Homes;Sensors;2022-01-28
5. Sydr: Cutting Edge Dynamic Symbolic Execution;2020 Ivannikov Ispras Open Conference (ISPRAS);2020-12
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