Author:
Jeffery C.M.,Basagalar A.,Figueiredo R.J.O.
Cited by
2 articles.
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1. Radiation Hardened Circuits in Multiple Harsh Environments;IOP Conference Series: Materials Science and Engineering;2020-12-01
2. Fault-tolerance techniques for hybrid CMOS/nanoarchitecture;IET Computers & Digital Techniques;2010-05-01