Embedding hafnium oxide based FeFETs in the memory landscape
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/8391403/8399713/08399771.pdf?arnumber=8399771
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. FeFET-Based Logic-in-Memory Supporting SA-Free Write-Back and Fully Dynamic Access With Reduced Bitline Charging Activity and Recycled Bitline Charge;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-06
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5. A new electrode structure of IrOx/Bi-doped SrRuO3 for highly reliable La-doped Pb (Zr, Ti)O3-based ferroelectric memories;2023 22nd International Symposium INFOTEH-JAHORINA (INFOTEH);2023-03-15
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