Author:
Wang S.-J.,Misium G.R.,Camp J.C.,Chen K.-L.,Tigelaar H.L.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
15 articles.
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1. The Effect of the Dielectric Layer with Surface Plasma Treatment on Characteristics of Amorphous Silicon Antifuse;Electronics;2022-10-29
2. Effect of Ion Implant Modification on Electrical Properties of MTM Antifuse a-Si Films;IEEE Transactions on Device and Materials Reliability;2020-03
3. Stuck-at Fault Resilience using Redundant Transistor Logic Gates;2019 IEEE Intl Conf on Dependable, Autonomic and Secure Computing, Intl Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and Big Data Computing, Intl Conf on Cyber Science and Technology Congress (DASC/PiCom/CBDCom/CyberSciTech);2019-08
4. P-Val: Antifuse-Based Package-Level Defense Against Counterfeit ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-07
5. Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects;IEEE Journal of the Electron Devices Society;2015-07