Analog ASIC TID behavior in a temperature range-Reference-Cited by-同舟云学术

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Analog ASIC TID behavior in a temperature range

Published:2017-10 Issue: Volume: Page:
ISSN:
Container-title:2017 IEEE 30th International Conference on Microelectronics (MIEL)
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Author:

Borisov A.Y.,Kessarinskiy L.N.,Vanzha M.M.,Belova M.P.,Moskovskaya Y.M.,Boychenko D.V.,Nikiforov A.Y.,Enns V.V.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8166373/8190056/08190080.pdf?arnumber=8190080

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Characterization Method for TID Versus Temperature Effects on Microelectronic Circuits;IEEE Transactions on Nuclear Science;2024-08

2. The Optimal Estimation of Single Event Effects Sensitivity Parameters Using a Focused Laser Source and Heavy Ion Cyclotron on Example of a Library of Analog IP Units;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

3. An Automated System of Lowered Temperature Setting for Long-Term Radiation Experiments;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

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