Defect Exposure in Vegetables and Fruits using Machine Learning-Reference-Cited by-同舟云学术

Defect Exposure in Vegetables and Fruits using Machine Learning

Published:2023-01-23 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Computer Communication and Informatics (ICCCI)
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Author:

Spandana S.¹,Sathiya M²,Krishnan Kesavan³,Kiran Ajmeera¹

Affiliation:

1. MLR Institute of Technology,Department of Computer Science and Engineering,Hyderabad,India

2. Karpagam Institute of Technology,Department of Information Technology,Coimbatore

3. Universiti Malaya,Faculty of Computer Science and Information Technology,Kuala Lumpur,Malaysia

Publisher

IEEE

Link

Reference14 articles.

1. DETECTION AND CATEGORIZATION OF PLANT LEAF DISEASES USING NEURAL NETWORKS;praveena;Eur J Mol Clin Med,2020

3. Secure Smart Green House Farming using Blockchain Technology;chinnasamy;Turkish Journal of Computer and Mathematics Education (TURCOMAT),2021

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