TRL-calibration Standards with Emphasis on Crosstalk Reduction
Author:
Affiliation:
1. University of Bordeaux, 351 cours de la Libération,IMS Laboratory,Talence cedex,France,33405
2. National Institute of Technology Calicut,Kozhikode,Kerala,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9792218/9792321/09792326.pdf?arnumber=9792326
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1. Design of Silicon On-Wafer Sub-THz Calibration Kit
2. Improved RF Hardware and Calibration Method for Network Analyzers;rytting,0
3. A 55 nm triple gate oxide 9 metal layers SiGe BiCMOS technology featuring 320 GHz fT/ 370 GHz fMAX HBT and high-Q millimeter-wave passives;chevalier;Proc IEEE Int Electron Devices Meeting (IEDM),2014
4. Impact of on-Silicon De-Embedding Test Structures and RF Probes Design in the Sub-THz Range
5. Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE Cosimulation
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