Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/4118420/04118424.pdf?arnumber=4118424
Cited by 38 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optimal scheme and estimation for a bivariate step‐stress accelerated life test with the inverse Weibull distribution under type‐I progressive censored samples;Quality and Reliability Engineering International;2023-07-28
2. Parameters Estimate of Step-Stress in Accelerated Life Tests of Exp. Distribution with Type I Censor;2022 8th International Conference on Contemporary Information Technology and Mathematics (ICCITM);2022-08-31
3. Bivariate Step-Stress Accelerated Life Tests for the Kavya–Manoharan Exponentiated Weibull Model under Progressive Censoring with Applications;Symmetry;2022-08-29
4. Optimal Design for a Bivariate Step-Stress Accelerated Life Test with Alpha Power Exponential Distribution Based on Type-I Progressive Censored Samples;Symmetry;2022-04-16
5. Optimal Plan and Estimation for Bivariate Step-Stress Accelerated Life Test under Progressive Type-I Censoring;Pakistan Journal of Statistics and Operation Research;2021-09-03
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