Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
6 articles.
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1. A general and efficient framework for improving Balanced Failure Biasing;2020 IEEE 20th International Conference on Software Quality, Reliability and Security Companion (QRS-C);2020-12
2. Path-ZVA;ACM Transactions on Modeling and Computer Simulation;2018-08-09
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