Characterizing TeO2 Formation in CdTe Devices Using Transmission Electron Microscopy
Author:
Affiliation:
1. University of Illinois at Chicago,Chicago,IL,U.S.A.,60607
2. University of Toledo,Toledo,OH,U.S.A.,43606
3. Colorado State University,Fort Collins,CO,U.S.A.,80523
Funder
Energy's Office of Energy Efficiency and Renewable Energy (EERE)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10359507/10359504/10359610.pdf?arnumber=10359610
Reference5 articles.
1. Detailed Balance Limit of Efficiency of p‐n Junction Solar Cells
2. Effects of non-uniformity on rollover phenomena in CdS/CdTe solar cells
3. Native tellurium dioxide layer on cadmium telluride: A high‐resolution electron microscopy study
4. Impact of Valence States on Superconductivity of Oxygen Incorporated Iron Telluride and Iron Selenide Films;Wells;Physical review,2011
5. Te/CdTe and Al/CdTe Interfacial Energy Band Alignment by Atomistic Modeling
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