Author:
Barbero M.,Varner G.,Bozek A.,Browder T.,Fang F.,Hazumi M.,Igarashi A.,Iwaida S.,Kennedy J.,Kent N.,Olsen S.,Palka H.,Rosen M.,Ruckman L.,Stanic S.,Trabelsi K.,Tsuboyama T.,Uchida K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
14 articles.
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1. Review of radiation damage studies on DNW CMOS MAPS;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12
2. Modeling Charge Loss in CMOS MAPS Exposed to Non-Ionizing Radiation;IEEE Transactions on Nuclear Science;2013-08
3. Characterization of Bulk Damage in CMOS MAPS With Deep N-Well Collecting Electrode;IEEE Transactions on Nuclear Science;2012-08
4. A 3D Vertically Integrated Deep N-Well CMOS MAPS for the SuperB Layer0;Journal of Instrumentation;2011-01-05
5. 3D DNW MAPS for high resolution, highly efficient, sparse readout CMOS detectors;2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC);2009-10