Electromigration Effects in Processes of Nano- Structured Thin Films Growth-Reference-Cited by-同舟云学术

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Electromigration Effects in Processes of Nano- Structured Thin Films Growth

Published:2022-09-11 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 12th International Conference Nanomaterials: Applications & Properties (NAP)
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Author:

Dvornichenko Alina¹,Kharchenko Vasyl²,Kharchenko Dmitrii³,Petrov Serhii⁴

Affiliation:

1. Sumy State University,Dpt. Applied mathematics and modeling of complex systems,Sumy,Ukraine

2. Sumy State University Institute of Applied Physics National Academy of Sciences of Ukraine,Sumy,Ukraine

3. Institute of Applied Physics National Academy of Sciences of Ukraine,Sumy,Ukraine

4. Sumy State University,Dpt. Computer science,Sumy,Ukraine

Funder

Ministry of Education and Science of Ukraine

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9933722/9933995/09934410.pdf?arnumber=9934410

Reference22 articles.

1. Step bunching with both directions of the current: Vicinal W(110) surfaces versus atomistic-scale model

2. Electromigration effect on the surface morphology during the Ge deposition on Si(1 1 1) at high temperatures

3. Fundamental processes in Si/Si and Ge/Si epitaxy studied by scanning tunneling microscopy during growth

4. Shape transition in very large germanium islands on Si(111)

5. Properties of three-dimensional structures prepared by Ge dewetting from Si(111) at high temperatures

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