MMF-based polarization state measurement system with temperature resistance-Reference-Cited by-同舟云学术

MMF-based polarization state measurement system with temperature resistance

Published:2023-07-02 Issue: Volume: Page:
ISSN:
Container-title:2023 Opto-Electronics and Communications Conference (OECC)
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Author:

Xiong Yuxuan¹,Jiang Ting¹,Ge Zhao¹,Wu Hao¹,Zhou Shaojun²,Gao Zheng¹,Zhou Jiajun¹,Tang Ming¹

Affiliation:

1. Huazhong University of Science and Technology,School of Optical and Electronic Information and Wuhan National Laboratory for Optpelectronics, Optics Valley Laboratory,Wuhan,China

2. Huazhong University of Science and Technology,School of Mechanical Science and Engineering,Wuhan,China

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10209604/10209571/10209861.pdf?arnumber=10209861

Reference6 articles.

1. Error Analysis of a Rotating Quarter-Wave Plate Stokes' Polarimeter

2. Rotating-wave-plate Stokes polarimeter for differential group delay measurements of polarization-mode dispersion

3. Deep learning-enabled broadband full-Stokes polarimeter with a portable fiber optical spectrometer

4. Polarization state generation and measurement with a single metasurface

5. Metasurface hologram for polarization measurement

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