13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS-Reference-Cited by-同舟云学术

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13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS

Published:2014-02 Issue: Volume: Page:
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Container-title:2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)
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Author:

Frustaci Fabio,Khayatzadeh Mahmood,Blaauw David,Sylvester Dennis,Alioto Massimo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6747109/6757318/06757419.pdf?arnumber=6757419

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