Author:
Blaauw David,Kalaiselvan Sudherssen,Lai Kevin,Ma Wei-Hsiang,Pant Sanjay,Tokunaga Carlos,Das Shidhartha,Bull David
Cited by
82 articles.
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1. Understanding and Mitigating Hardware Failures in Deep Learning Training Systems;Proceedings of the 50th Annual International Symposium on Computer Architecture;2023-06-17
2. Performance Screening Using Functional Path Ring Oscillators;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06
3. ML-Accelerated Yield Analysis Framework Using Regularization for Sparsity in High-Sigma and High-Dimensional Scenarios;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04
4. Feature Selection for Cost Reduction In MCU Performance Screening;2023 IEEE 24th Latin American Test Symposium (LATS);2023-03-21
5. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023