An experimental study of carrier heating on channel noise in deep-submicrometer NMOSFETs via body bias
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Published:2005-02
Issue:2
Volume:53
Page:564-570
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ISSN:0018-9480
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Container-title:IEEE Transactions on Microwave Theory and Techniques
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language:
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Short-container-title:IEEE Trans. Microwave Theory Techn.
Author:
Hong Wang ,Rong Zeng ,Xiuping Li
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation