Temperature Effect on $Ku$-Band Current-Reused Common-Gate LNA in 0.13-$\mu{\hbox{m}}$ CMOS Technology

Author:

Wen-Lin Chen ,Sheng-Fuh Chang ,Kun-Ming Chen ,Guo-Wei Huang ,Jen-Chung Chang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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