Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter-Reference-Cited by-同舟云学术

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Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter

Published:2002-12 Issue:12 Volume:50 Page:3022-3028
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Scott J.B.,Verspecht J.,Behnia B.,Vanden Bossche M.,Cognata A.,Verbeyst F.,Thorn M.L.,Scherrer D.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/22/24077/01098027.pdf?arnumber=1098027

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nonlinear Data Utilization: From Direct Data Lookup to Behavioral Modeling;IEEE Transactions on Microwave Theory and Techniques;2009-06

2. Absolute Magnitude and Phase Calibrations;Electrical Engineering Handbook;2007-12-22

3. Large-signal network analysis;IEEE Microwave Magazine;2005-12

4. Mixer-based, vector-corrected, vector signal/network analyzer offering 300kHz-20GHz bandwidth and traceable phase response;IEEE MTT-S International Microwave Symposium Digest, 2005.;2005

5. A new instrument architecture for millimetre-wave time-domain signal analysis;ARFTG 63rd Conference, Spring 2004;2004

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