Time-Variant In-Circuit Impedance Monitoring Based on the Inductive Coupling Method

Author:

Zhao ZhenyuORCID,See Kye-Yak,Chua Eng-Kee,Narayanan Arun Shankar,Chen Wayne,Weerasinghe Arjuna

Funder

Nanyang Technological University

Corp Lab@University Scheme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty;IET Power Electronics;2023-11-20

3. High Precision SoC Estimation of LiFePO4 Blade Batteries Using Improved OCV-Based PNGV Model;IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society;2023-10-16

4. A Novel Single-Probe Setup for Multifrequency Simultaneous Measurement of In-Circuit Impedance;IEEE Transactions on Industrial Electronics;2023-09

5. In-Circuit Impedance Measurement Setups of Inductive Coupling Approach: A Review;2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2022-09-01

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