Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems-Reference-Cited by-同舟云学术

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Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

Published:2023-12-14 Issue: Volume:28 Page:1-5
ISSN:
Container-title:2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE)
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Author:

Tian Yu¹,Liu Pei¹,Rui Erming¹,Jiao Qiang¹,Xiong Yuanyuan¹,Dong Yanlei¹,Ma Yue²,Li Junlin²

Affiliation:

1. China Astronautics Standards Institute,Space Components Guarantee Research Institute,Beijing,China

2. Changchun Institute of Optics,Fine Mechanics and Physics Chinese Academy of Sciences,Changchun,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10492487/10492472/10492516.pdf?arnumber=10492516

Reference10 articles.

1. Review on optical visual sensor technology;Xu;Journal of Image and Graphics,2023

2. Study on imaging performance test technology of CMOS image sensor;Mao;Changchun Institute of Optics Fine Mechanics and Physics Chinese Academy of Sciences,2022

3. Application of CCD image sensor in military weapon equipment;Cheng;Integrated circuit communication,2007

4. Application of CMOS image sensor to digital still camera;Fan;Chinese Journal of Liquid Crystals and Displays,2022

5. A design of image acquisition and test system for CMOS image sensor;Yao;Journal of Luoyang Institute of Science and Technology (Natural Science Edition),2016

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