Assessment of capture cross sections and effective density of electron traps generated in silicon dioxides-Reference-Cited by-同舟云学术

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Assessment of capture cross sections and effective density of electron traps generated in silicon dioxides

Published:2006-06 Issue:6 Volume:53 Page:1347-1354
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Mo Huai Chang ,Zhang J.F.,Zhang W.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/34324/01637630.pdf?arnumber=1637630

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