Pressure Dependence of the Relativistic Rise in Neon and Highest Attainable Ionization Sampling Resolution in Neon, Argon, Ethylene and Propane-Reference-Cited by-同舟云学术

Pressure Dependence of the Relativistic Rise in Neon and Highest Attainable Ionization Sampling Resolution in Neon, Argon, Ethylene and Propane

Published:1983-02 Issue:1 Volume:30 Page:50-59
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Lehraus I.,Matthewson R.,Tejessy W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/4332203/04332218.pdf?arnumber=4332218

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