Investigation of Single-Bit and Multiple-Bit Upsets in Oxide RRAM-Based 1T1R and Crossbar Memory Arrays-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Investigation of Single-Bit and Multiple-Bit Upsets in Oxide RRAM-Based 1T1R and Crossbar Memory Arrays

Published:2015-10 Issue:5 Volume:62 Page:2294-2301
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Liu Rui,Mahalanabis Debayan,Barnaby Hugh J.,Yu Shimeng

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7295655/07274484.pdf?arnumber=7274484

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanoscale memristive devices: Threats and solutions;Nanoscale Memristor Device and Circuits Design;2024

2. Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. Statistical Modeling of Metal-Oxide RRAM SET/RESET Behavior Using Deep Neural Networks;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27

4. Progress on Memristor-Based Analog Logic Operation;Electronics;2023-05-31

5. A survey on two-dimensional Error Correction Codes applied to fault-tolerant systems;Microelectronics Reliability;2022-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP