Author:
De Rose Raffaele,Lanuzza Marco,Crupi Felice,Siracusano Giulio,Tomasello Riccardo,Finocchio Giovanni,Carpentieri Mario,Alioto Massimo
Cited by
4 articles.
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1. Machine Learning for Statistical Modeling;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
2. A Variation-Aware Timing Modeling Approach for Write Operation in Hybrid CMOS/STT-MTJ Circuits;IEEE Transactions on Circuits and Systems I: Regular Papers;2018-03
3. A Compact Model with Spin-Polarization Asymmetry for Nanoscaled Perpendicular MTJs;IEEE Transactions on Electron Devices;2017-10
4. Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework;2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2017-06