1. Advanced Research Institute for Multidisciplinary Science and the School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China
2. School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China
3. State Key Laboratory of Dynamic Measurement Technology and the National Key Laboratory for Electronic Measurement Technology, School of Instrument and Electronics, North University of China, Taiyuan, China
4. Advanced Research Institute for Multidisciplinary Science, the School of Integrated Circuits and Electronics, and the School of Physics, Beijing Institute of Technology, Beijing, China