Wide-Spectrum Ellipsometry Measurement Based on Two Parallel Channels
Author:
Affiliation:
1. Provincial Photoelectric Information and Instrument Engineering Technical Research Center, North University of China, Taiyuan, China
Funder
Fundamental Research Program of Shanxi Province
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/7361/10168680/10130775.pdf?arnumber=10130775
Reference16 articles.
1. Broadband infrared Mueller-matrix ellipsometry for studies of structured surfaces and thin films;andreas;Appl Opt,2018
2. Vacuum variable-angle far-infrared ellipsometer;pavel;Appl Surf Sci,2017
3. Developments in THz-Range Ellipsometry: Quasi-Optical Ellipsometer
4. Terahertz ellipsometry and terahertz optical-Hall effect
5. A Wide-Range Spectroscopic Ellipsometer with Switching of Orthogonal Polarization States Based on the MDR-41 Monochromator
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