Angle-Dependent Metasurface for Nonspectroscopic THz Sensing of Submicrometer Films-Reference-Cited by-同舟云学术

Angle-Dependent Metasurface for Nonspectroscopic THz Sensing of Submicrometer Films

Published:2023-11-15 Issue:22 Volume:23 Page:27262-27272
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Tumashov Maksim A.¹^ORCID,Baena Juan D.²^ORCID,del Risco Juan P.²^ORCID,Lazorskiy Pavel A.³^ORCID,Glybovski Stanislav B.¹^ORCID,Kuznetsov Sergei A.⁴^ORCID

Affiliation:

1. School of Physics and Engineering, ITMO University, St. Petersburg, Russia

2. Physics Department, Universidad Nacional de Colombia, Bogota, Colombia

3. Physics Department, Novosibirsk State University, Novosibirsk, Russia

4. Laboratory of Terahertz Photonics, Institute of Automation and Electrometry SB RAS, Novosibirsk, Russia

Funder

Russian Science Foundation for numerical simulations and measurements

Departamento Administrativo de Ciencia, Tecnología e Innovación (COLCIENCIAS) for initial theoretical analysis and conceptualization of the metasurface structure

Universidad Nacional de Colombia

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/10316685/10269812.pdf?arnumber=10269812

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