Analytic modeling of the bias temperature instability using capture/emission time maps-Reference-Cited by-同舟云学术

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Analytic modeling of the bias temperature instability using capture/emission time maps

Published:2011-12 Issue: Volume: Page:
ISSN:
Container-title:2011 International Electron Devices Meeting
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Author:

Grasser T.,Wagner P.-J.,Reisinger H.,Aichinger Th.,Pobegen G.,Nelhiebel M.,Kaczer B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6123666/6131464/06131624.pdf?arnumber=6131624

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