High-performance, cost-effective 2z nm two-deck cross-point memory integrated by self-align scheme for 128 Gb SCM-Reference-Cited by-同舟云学术

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High-performance, cost-effective 2z nm two-deck cross-point memory integrated by self-align scheme for 128 Gb SCM

Published:2018-12 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE International Electron Devices Meeting (IEDM)
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Author:

Kim Taehoon,Choi Hyejung,Kim Myoungsub,Yi Jaeyun,Kim Donghoon,Cho Sunglae,Lee Hyunmin,Hwang Changyoun,Hwang Eung-Rim,Song Jeongho,Chae Sujin,Chun Yunseok,Kim Jin-Kook

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8601505/8614478/08614680.pdf?arnumber=8614680

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