Local thermometry of self-heated nanoscale devices-Reference-Cited by-同舟云学术

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Local thermometry of self-heated nanoscale devices

Published:2016-12 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Electron Devices Meeting (IEDM)
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Author:

Menges F.,Motzfeld F.,Schmid H.,Mensch P.,Dittberner M.,Karg S.,Riel H.,Gotsmann B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7824662/7838021/07838427.pdf?arnumber=7838427

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Self-Heating of FinFET Circuitry Simulated by Multi-Correlated Recurrent Neural Networks;IEEE Electron Device Letters;2022-08

2. Experimental Evaluation of Self-Heating and Analog/RF FOM in GAA-Nanowire FETs;IEEE Transactions on Electron Devices;2019-08

3. Thermal SPICE Modeling of FinFET and BEOL Considering Frequency-Dependent Transient Response, 3-D Heat Flow, Boundary/Alloy Scattering, and Interfacial Thermal Resistance;IEEE Transactions on Electron Devices;2019-06

4. Remote heat dissipation in atom-sized contacts;Scientific Reports;2018-05-18

5. The investigation of self-heating effect on Si1-xGex FinFETs with different device structures, Ge concentration, and operated voltages;AIP Advances;2017-05

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