Author:
Lee S.H.,Park H.C.,Kim M.S.,Kim H.W.,Choi M.R.,Lee H.G.,Seo J.W.,Kim S.C.,Kim S.G.,Hong S.B.,Lee S.Y.,Lee J.U.,Kim Y.S.,Kim K.S.,Kim J.I.,Lee M.Y.,Shin H.S.,Chae S.J.,Song J.H.,Yoon H.S.,Oh J.M.,Min S.K.,Lee H.M.,Hong K.R.,Cheong J.T.,Park S.N.,Ku J.C.,Sohn Y.S.,Park S.K.,Kim T.S.,Kim Y.K.,Park K.W.,Han C.S.,Kim W.,Kim H.J.,Choi K.S.,Lee J.H.,Hong S. J.
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20 articles.
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4. Energy-efficient and Reliable Inference in Nonvolatile Memory under Extreme Operating Conditions;ACM Transactions on Embedded Computing Systems;2022-09-30
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